The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.A partial list of topics covered in the journal includes: testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.In addition to original research papers, the journal publishes conference papers of exceptional merit. Readers will also find surveys and reviews examining the state of the art in the field.
《电子测试杂志》是唯一专门从事电子测试的杂志，它是一个国际论坛，传播该领域的最新研究成果和应用。随着期刊迅速进入出版周期，它迅速地将重要的发现引起了研究者和实践者的注意。期刊所涵盖的部分主题包括：VLSI器件、印刷电路板和电子系统的测试；故障建模和模拟；测试生成；可测试性设计；电子束测试系统；硬件的正式验证；验证模拟；设计调试；测试经济性；质量和可靠性和CAD工具。除了最初的研究论文外，该杂志还发表了具有卓越功绩的会议论文。读者还可以找到调查和评论，研究该领域的最新技术。
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